- June 8–12, 2026 | Seignosse-Hossegor, Landes, France
Failure Analysis of Electronic Components and Assemblies
The 20th ANADEF Workshop took place from June 8 to 12, 2026, at Club Belambra Business Resort “Les Tuquets” in Seignosse-Hossegor, Landes, France.
For 40 years, the ANADEF association and its experts have gathered every two years for five days of shared exchange. The workshop focused on the failure analysis of electronic components and assemblies.
The programme included tutorials designed to introduce or deepen theoretical knowledge, sessions dedicated to practical case studies, and micro-workshops focused on unresolved issues and operational challenges encountered within laboratory settings.
JIACO Instruments attended the workshop to connect with the failure analysis community and discuss how Microwave-Induced Plasma technology can support selective sample preparation and decapsulation workflows.
Why ANADEF matters to JIACO Instruments
40 years of specialist exchange
The 20th ANADEF Workshop continued a 40-year tradition of bringing specialists together every two years for five days focused on the failure analysis of electronic components and assemblies.
From theory to unresolved lab issues
Tutorials, practical case-study sessions and micro-workshops connected theoretical knowledge with unresolved operational challenges encountered in laboratory settings.
Relevant to selective sample preparation
ANADEF’s focus on component and assembly failure analysis closely relates to JIACO’s work with Microwave Induced Plasma for selective sample preparation and decapsulation workflows.
Direct exchange with the FA community
For JIACO Instruments, attending created a focused setting to discuss practical preparation needs with failure-analysis specialists and explore where MIP can support their workflows.
Looking Back at ANADEF 2026
The 20th ANADEF Workshop brought together specialists in electronic component and assembly failure analysis for five days of technical exchange.
The program included tutorials for developing theoretical knowledge, sessions focused on practical case studies, and micro-workshops addressing unresolved issues and laboratory-based challenges.
For JIACO Instruments, the workshop provided a relevant setting to connect with the failure analysis community and discuss how Microwave-Induced Plasma technology can support selective sample preparation and decapsulation workflows.
Let's Continue the Conversation
Thank you for visiting JIACO Instruments. Whether we met at a conference, exhibition, workshop or technical presentation, we look forward to continuing the conversation.
Our team supports engineers, researchers and failure analysis specialists with advanced semiconductor sample preparation, controlled material removal and access to critical structures.