During May, you will have the opportunity to learn from JIACO Instruments at several leading conferences and exhibitions we will be attending. Be sure to note the following presentation dates during these conferences to discover our latest applications and solutions: RadNext Workshop – held in Rome, ItalyOn May 6th, our colleague Yashan Peng-Shan Peng will
Undetected wire bond defects can lead to intermittent faults or premature device failure, even when samples pass electrical curve trace analysis. JIACO Instruments’ MIP decapsulation offers a faster way to uncover these subtle issues, as minor bonding defects become visible through simple optical inspection. In a recent case study, an electrically failing PCC sample revealed oxidised, rough-surfaced defective bonds after MIP processing—providing clear visual evidence that traditional decapsulation methods can miss.
Congratulations to Mr. Sorrells, Mr. Nielsen, Mr. Walters of Microchip Technology and Dr. Tang, and Mr. McKinnon of JIACO Instruments, who have received confirmation that their manuscript “Optimizations and Case Studies: Decapsulation of Hardened Epoxy SiC MOSFETs and Diodes via JIACO Microwave-Induced Plasma Etching” was selected as an Editor’s Choice article for 2025 from the
Electrical overstress (EOS) occurs when the voltage, current, or power in the device exceeds some maximal limit, inducing thermal damage in the device. This is one of the most common types of electrical failures, found in all stages of the IC device life cycle. Determining the root cause of EOS is integral to prevent future failures, but due to the thermal stress, the failure
A known challenge is preserving copper bond wires during decapsulation, as conventional acid processes can damage the wires. This becomes even more critical when silver-plated leadframes are used, since acid and conventional plasma etching readily attack silver and make stitch bond exposure difficult. This work, by Sumitomo Bakelite, presents a decapsulation process based on Microwave
2025 has been a meaningful year for JIACO Instruments in many ways. We commemorate the passing of our co-founder, Prof. Kees Beenakker. His pioneering work and the inspiration he shared with colleagues continue to shape the MIP and guide JIACO Instruments into the future. We’re proud of our achievements in 2025, including: – Plenary talk by Prof. Kees Beenakker at ICEPT 2025 –
