- Oct 4 - 8 | San Antonio, Texas | Booth 525
Preparing for ISTFA 2026
International Symposium for Testing and Failure Analysis
JIACO Instruments will be exhibiting at ISTFA 2026. You'll find us at Booth 525, Hall 4B, in the Henry B. Gonzalez Convention Center throughout the technical sessions and exhibition.
Stop by to see our Microwave Induced Plasma (MIP) technology in action, catch our live demo during the Tools of the Trade Tour, and join us Monday evening for the MIP User Group Meeting.
Program highlights
Visit us at Booth 525
Meet the JIACO team on the exhibition floor, Hall 4B, throughout the conference.
Live demo: Tools of the Trade Tour
Mon 5 Oct, 5:30-7:30 PM. Wire bond and advanced package case studies live.
MIP User Group Meeting
Mon 5 Oct, 7:15-9:45 PM, Room 209. Updates, applications, roadmap, and a reception.
See MIP+ for advanced packaging
Ion-free die-level etching, compared to traditional decapsulation methods.
Join the conversation
MIP User Group Meeting
Monday, October 5 · 7:15–9:45 PM · Room 209, Henry B. Gonzalez Convention Center
Meet fellow MIP and MIP+ users, hear the latest technical and application updates, and share your experience in an open discussion about what comes next. The evening continues with appetizers, drinks, and informal networking.
Why ISTFA matters to JIACO Instruments
ISTFA is the premier global event for failure analysis, reliability engineering, and materials characterization, bringing together scientists and engineers across semiconductors, aerospace, automotive, and beyond for technical sessions, workshops, and hands-on training.
For JIACO, it’s the best opportunity each year to put MIP and MIP+ in front of that audience directly, gather feedback from users pushing the technology into new applications, and see where the field is headed next.
Meet us at ISTFA 2026
Attending ISTFA 2026? Visit us at Booth 525 to discuss how Microwave-Induced Plasma technology can support selective decapsulation, controlled material removal, and advanced sample preparation for radiation-related device investigations.