- Oct 4 - 8 | San Antonio, Texas | Booth 525
JIACO at ISTFA 2026
International Symposium for Testing and Failure Analysis
JIACO Instruments exhibited at ISTFA 2026 from Booth 525, Hall 4B, in the Henry B. Gonzalez Convention Center throughout the technical sessions and exhibition.
During the event, visitors explored our Microwave Induced Plasma (MIP) technology, attended our live demonstration during the Tools of the Trade Tour and joined the MIP User Group Meeting.
Program highlights
Plasma-based sample preparation in failure analysis
Alisa Kondratyev and Sarah Zerouali presented three application examples covering polyimide removal on WLCSP, crack inspection on die sidewalls and SiC power devices, and bulk silicon removal for die backside access using MIP+. The examples demonstrated how selective plasma processing can preserve important structures and support reliable further analysis.
Technical exchange with the MIP user community
The MIP User Group Meeting brought MIP and MIP+ users together for technical and application updates, practical user experiences, questions and open discussion. Attendees also shared feedback and discussed priorities for future MIP and MIP+ developments.
Past meeting · ISTFA 2026
MIP User Group Meeting at ISTFA 2026
Held on Monday, October 5, 2026 · San Antonio, Texas
The meeting brought MIP and MIP+ users together for technical and application updates, shared user experiences and an open discussion about future developments. The programme concluded with informal networking between the JIACO team and the wider MIP user community.
Why ISTFA matters to JIACO Instruments
ISTFA is the premier global event for failure analysis, reliability engineering, and materials characterization, bringing together scientists and engineers across semiconductors, aerospace, automotive, and beyond for technical sessions, workshops, and hands-on training.
For JIACO, it’s the best opportunity each year to put MIP and MIP+ in front of that audience directly, gather feedback from users pushing the technology into new applications, and see where the field is headed next.
Let’s continue the conversation
Interested in the applications presented during the Tools of the Trade Tour or the topics discussed during the MIP User Group Meeting? Contact JIACO to discuss your sample-preparation challenges, explore MIP and MIP+ technology, or discover our technical publications.