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๐—œ๐—ฃ๐—™๐—” ๐Ÿฎ๐Ÿฌ๐Ÿฎ๐Ÿฑ: ๐—ฐ๐—ผ๐—น๐—น๐—ฎ๐—ฏ๐—ผ๐—ฟ๐—ฎ๐˜๐—ถ๐—ผ๐—ป ๐˜„๐—ถ๐˜๐—ต ๐—œ๐—ป๐—ณ๐—ถ๐—ป๐—ฒ๐—ผ๐—ป ๐—น๐—ฒ๐—ฎ๐—ฑ๐˜€ ๐˜๐—ผ ๐—ฒ๐˜…๐—ฐ๐—ถ๐˜๐—ถ๐—ป๐—ด ๐—ป๐—ฒ๐˜„ ๐—ฝ๐—ฎ๐—ฝ๐—ฒ๐—ฟ!

During this yearโ€™s IPFA conference we are excited to present a new paper with our customer Infineon Technologies โ€˜๐˜™๐˜ฆ๐˜ท๐˜ฐ๐˜ญ๐˜ถ๐˜ต๐˜ช๐˜ฐ๐˜ฏ๐˜ช๐˜ป๐˜ช๐˜ฏ๐˜จ ๐˜๐˜Š ๐˜—๐˜ข๐˜ค๐˜ฌ๐˜ข๐˜จ๐˜ฆ ๐˜‹๐˜ฆ๐˜ค๐˜ข๐˜ฑ๐˜ด๐˜ถ๐˜ญ๐˜ข๐˜ต๐˜ช๐˜ฐ๐˜ฏ ๐˜ธ๐˜ช๐˜ต๐˜ฉ ๐˜”๐˜ช๐˜ค๐˜ณ๐˜ฐ๐˜ธ๐˜ข๐˜ท๐˜ฆ-๐˜๐˜ฏ๐˜ฅ๐˜ถ๐˜ค๐˜ฆ๐˜ฅ-๐˜—๐˜ญ๐˜ข๐˜ด๐˜ฎ๐˜ข (๐˜”๐˜๐˜—) ๐˜š๐˜บ๐˜ด๐˜ต๐˜ฆ๐˜ฎโ€™, demonstrating new solutions to the industries challenges with preserving the Nickel-plating layer on the lead finger for repackaging, preservation of Cu wires in Film Over Wire (FOW) stacked-die device decapsulation. Failure analysis involves a series of steps to identify the root cause of a failed semiconductor IC. Current methods like acid or laser etching often damage these

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Radiation Testing: accurate decapsulation with MIP!

Radiation testing of semiconductors is crucial for devices used in environments with high radiation exposure, such as space or nuclear facilities. Understanding how radiation impacts your product is essential for reliability and performance. Decapsulation is necessary in radiation effects studies for semiconductors to expose the active die and allow for detailed testing & analysis of the radiationโ€™s effects to the device. This is crucial for understanding how radiation alters

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Another MIP Machine Supporting Advanced Packaging!

With significant momentum as the next breakthrough in semiconductor technology, the advanced packaging industry is experiencing rapid growth.Weโ€™re excited to announce that another leader in advanced packaging has selected our MIP technology to support their continued growth. As demonstrated in our recent plublications on advanced packaging, the MIP machine is invaluable for AI and advanced

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JIACO Instruments team visiting DIFFER

๐—๐—œ๐—”๐—–๐—ข ๐—œ๐—ป๐˜€๐˜๐—ฟ๐˜‚๐—บ๐—ฒ๐—ป๐˜๐˜€ ๐˜ƒ๐—ถ๐˜€๐—ถ๐˜๐˜€ ๐——๐—œ๐—™๐—™๐—˜๐—ฅ ๐—ถ๐—ป ๐—˜๐—ถ๐—ป๐—ฑ๐—ต๐—ผ๐˜ƒ๐—ฒ๐—ป!

Team JIACO Instruments recently visited the DIFFER facility in Eindhoven as part of our ongoing collaboration. We kicked off the day with a productive team meeting reflecting on the year so far and making exciting plans for the future. Xingyu Chen then gave us an inspiring tour of the facility where we collaborate on fundamental plasma research. The

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Engineer using a JIACO Instruments MIP Decapsulation machine.

5 reasons why every failure analysis team needs a MIP decapsulation machine

Semiconductor decapsulation has always been done with acid. But semiconductors are changing: theyโ€™re more delicate, more complex, more powerful. And decapsulation methods have to adapt โ€” or risk rendering samples useless by wiping out the evidence at failure sites.   The reality is, acid isnโ€™t fit for purpose anymore. Itโ€™s not selective or refined enough to give your

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Image showing a ball joint

Market trends affecting Semiconductor decapsulation

Semiconductor decapsulation is an increasingly challenging, delicate and time-pressured process. Acid has been the go-to for all labs โ€” but itโ€™s no longer a future-proof approach. The market is demanding more nuanced results than traditional acid decapsulation can deliver.   Here, weโ€™ll explore the trends combining to knock acid decapsulation off its dominant spot.   More IOs

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