MIP | Plasma Decapsulation

The global standard for the most demanding decapsulation challenges.

Preserve original failure sites & your sample

JIACO Instruments MIP decapsulation methods utilize atmospheric CF4-free plasma. Resulting in a high plasma density and preservation of your sample (and die) and the original failure sites.  

Ready to use, out of the box

JIACO Instruments MIP machine comes with field-proven pre-established recipes, removing the need for your own recipe development. The easy to operate interface together with the fully automatic process allows for the machine to be used by anyone in the lab and even be left overnight or over the weekend.

Patented Silver (Ag) Wire IC Decapsulation

JIACO’s Microwave Induced Plasma (MIP) system enables safe plasma decapsulation of IC packages with copper (Cu), palladium-coated copper (PCC), silver (Ag), and gold (Au) bond wires. The patented Ag-compatible plasma process preserves silver wires and silver alloys, avoiding the damage often caused by wet chemical acid decapsulation methods.

Ag wire after being decapsulated by JIACO MIP technology
Ag wire after MIP decapsulation

Microwave Induced Plasma Decapsulation

JIACO Instruments’ patented Microwave Induced Plasma (MIP) decapsulation system uses atmospheric plasma to achieve precise, highly localized etching with CF₄-free recipes tailored to customer-specific materials and package types, ensuring immediate usability and preventing plasma-induced die damage. Fully automatic and straightforward to operate, delivering artifact-free decapsulation that preserves device functionality and failure sites.  
 
Since its launch in 2016, MIP has set the industry standard for complex semiconductor package decapsulation, recognized in the JEDEC 2022 JESD22-B120 revision and supported by over 30 published studies at leading conferences. With nearly 100 systems deployed globally, JIACO Instruments MIP continues to advance through ongoing research and collaboration, meeting the latest challenges in modern semiconductor analysis.

Failproof sample analysis in 3 steps

1. Get in touch

Contact us to discuss your challenge and how we can help you solve it.

2. Solution validation

We demonstrate how we can solve your challenge using your own samples, so you can see the results firsthand.

3. On site commisioning

We deliver and commission your MIP system on site, anywhere in the world.

Leader in Plasma Decapsulation Technology

JIACO Instruments has over 30 papers published on MIP and plasma research, we are proud to show how the applications of our plasma decapsulation system keeps growing. Recognized by the JEDEC standard in JESD22-B120, our patented MIP technology offers non-destructive decapsulation that preserves copper and silver wire integrity. Backed by a global service team, JIACO Instruments supports our customers worldwide with fast responses, and a high personal level of service.

30+ peer reviewed publications

JEDEC industry standard

Excellent application support

Download our whitepaper