JIACO Instruments proud to be presenting, sponsoring & exhibiting at “Hardware Reverse Engineering Workshop” (HARRIS 2026) in Bochum, Germany.

At the 4th Hardware Reverse Engineering Workshop (HARRIS 2026) in Bochum, Germany (March 24–25), Ya-Shan Peng will present on March 24 at 11:30AM. Her talk highlights how atmospheric Microwave-Induced Plasma (MIP) enables precise sample preparation of advanced semiconductor packages, unlocking new possibilities for hardware reverse engineering and security assessment.

Manuscript featuring MIP selected as an Editor’s Choice article for2025 from the Journal of Failure Analysis and Prevention.

Congratulations to Mr. Sorrells, Mr. Nielsen, Mr. Walters of Microchip Technology and Dr. Tang, and Mr. McKinnon of JIACO Instruments, who have received confirmation that their manuscript “Optimizations and Case Studies: Decapsulation of Hardened Epoxy SiC MOSFETs and Diodes via JIACO Microwave-Induced Plasma Etching” was selected as an Editor’s Choice article for 2025 from the […]