- 24 – 25 March 2026 | Bochum, Germany | Presenter & Exhibitor
Advancing Sample Preparation for Radiation Effects Analysis
The 4th Hardware Reverse Engineering Workshop (HARRIS 2026) brought together researchers, engineers, government organisations, and industry professionals focused on hardware reverse engineering and semiconductor security.
As a sponsor, exhibitor, and presenter, JIACO Instruments engaged with attendees throughout the event while contributing to the technical programme through a presentation delivered by Ya-Shan Peng.
The presentation, “Precision Sample Preparation of Advanced Packages Using Atmospheric Microwave-Induced Plasma for Hardware Reverse Engineering and Security Assessment,” explored how controlled plasma decapsulation can help expose critical structures within advanced semiconductor packages.
Why HARRIS Matters to JIACO Instruments
Reliable Analysis Starts with Reliable Sample Preparation
Hardware reverse engineering often requires access to bond wires, interconnects, die surfaces, and other critical structures hidden beneath encapsulating materials.
Controlled IC Package Decapsulation
JIACO Instruments' Microwave-Induced Plasma (MIP) technology supports controlled IC package decapsulation for reverse engineering, security assessment, and semiconductor investigation applications. The process helps expose regions of interest while minimising the risk of preparation-related damage.
Supporting Security Assessment Workflows
As package technologies continue to evolve, access to internal device structures becomes increasingly challenging. The JIACO Instruments MIP System helps laboratories prepare advanced semiconductor packages for further inspection, characterisation, and analysis.
Looking Back at HARRIS 2026
HARRIS 2026 provided valuable opportunities to connect with the hardware reverse engineering community and discuss the challenges associated with analysing increasingly complex semiconductor devices.
Throughout the event, JIACO Instruments engaged with attendees, shared application expertise, and delivered a technical presentation on atmospheric Microwave-Induced Plasma technology. The conference also generated several promising follow-up discussions with organisations interested in advanced sample preparation solutions.
If you’d like to receive a copy of Ya-Sha’s presentation, you can request it via our websites contact form or email us at [email protected]
Let's Continue the Conversation
Thank you for visiting JIACO Instruments. Whether we met at a conference, exhibition, workshop, or technical presentation, we look forward to continuing the conversation.
Our team supports engineers, researchers, and failure analysis specialists with advanced semiconductor sample preparation, controlled material removal, and access to critical structures.
