- July 20 – 24, 2026 | San Juan, Puerto Rico | Booth 32
Sample Preparation for Radiation Effects Analysis
JIACO Instruments attended NSREC 2026, the Nuclear and Space Radiation Effects Conference, which took place from July 20 to 24, 2026, in San Juan, Puerto Rico. During the event, visitors could meet the JIACO Instruments team at Booth 32.
NSREC is a leading international conference dedicated to radiation effects in electronic devices, circuits, and systems used in space, nuclear, and other radiation-sensitive environments. The conference brought together researchers, engineers, and industry experts to share developments in radiation effects, mitigation techniques, and the reliability of electronic systems in harsh environments.
Program highlights
JIACO at Booth 32
Visitors met the JIACO team to discuss selective MIP decapsulation, controlled material removal and sample preparation for radiation-related device investigations.
Radiation Effects Technical Sessions
The technical program covered radiation effects in electronic and photonic materials, devices, circuits, sensors and systems, including single-event effects, total dose and displacement damage.
Radiation Hardness Assurance Short Course
The July 20 course examined practical radiation-hardness strategies for new space missions and advanced electronics, including COTS, system-on-chip and 2.5D/3D technologies.
Radiation Effects Data Workshop
The July 23 workshop shared radiation-response data, testing methods, irradiation-facility developments and device qualification results from across the radiation-effects community.
Why NSREC matters to JIACO Instruments
For JIACO Instruments, NSREC is a valuable opportunity to connect with specialists working on radiation testing, device reliability and failure analysis workflows. These applications often require careful sample preparation, where relevant device structures need to be exposed while preserving critical failure evidence. Only highly selective MIP decapsulation can support this balance, helping to ensure that these structures are not compromised by the decapsulation process itself.
Let's Continue the Conversation
Thank you for visiting JIACO Instruments. Whether we met at a conference, exhibition, workshop or technical presentation, we look forward to continuing the conversation.
Our team supports engineers, researchers and failure analysis specialists with advanced semiconductor sample preparation, controlled material removal and access to critical structures.