Radiation testing of semiconductors is crucial for devices used in environments with high radiation exposure, such as space or nuclear facilities. Understanding how radiation impacts your product is essential for reliability and performance.
Decapsulation is necessary in radiation effects studies for semiconductors to expose the active die and allow for detailed testing & analysis of the radiationโs effects to the device. This is crucial for understanding how radiation alters the semiconductorโs electrical properties and to validate simulation models
The real challenge?
Exposing the die without introducing any damage from the decapsulation process itself.
Our MIP atmospheric plasma system enables damage-free decapsulation with high selectivity, ensuring your devices are decapsulated 1st time right so you can accurately simulate the radiation damage devices may see when in space.
๐๐ข๐ฏ๐ต ๐ต๐ฐ ๐ญ๐ฆ๐ข๐ณ๐ฏ ๐ฎ๐ฐ๐ณ๐ฆ ๐ข๐ฃ๐ฐ๐ถ๐ต ๐ฐ๐ถ๐ณ ๐ด๐ฐ๐ญ๐ถ๐ต๐ช๐ฐ๐ฏ๐ด ๐ง๐ฐ๐ณ ๐ง๐ข๐ช๐ญ๐ถ๐ณ๐ฆ ๐ข๐ฏ๐ข๐ญ๐บ๐ด๐ช๐ด ๐ข๐ฏ๐ฅ ๐ด๐ข๐ฎ๐ฑ๐ญ๐ฆ ๐ฑ๐ณ๐ฆ๐ฑ๐ข๐ณ๐ข๐ต๐ช๐ฐ๐ฏ?
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