JIACO instruments at RADECS 2026

RADiation and its Effects on Components and Systems Conference

Sep 28 - Oct 2, 2026 | Prague, Czech Republic | Booth 11

Preparing for RADECS 2026

RADiation and its Effects on Components and Systems Conference

JIACO Instruments will be exhibiting at RADECS 2026, the leading European conference on radiation effects in electronics and photonics. You’ll find us at Booth 11 in the Prague Congress Centre throughout the technical session and industrial exhibition.

Stop by to see how our Microwave Induced Plasma (MIP) technology supports sample preparation for radiation testing, and to talk through your failure analysis challenges with our team.

Programme Highlights

Visit Us at Booth 11 Meet the JIACO team at the Prague Congress Centre exhibition floor throughout the conference. MIP for Radiation-Test Prep Talk to us about how MIP decapsulation supports sample preparation for radiation effects testing and failure analysis. See MIP in Action Ask us about demonstrations and how MIP decapsulation compares to traditional acid-based methods. Open Exhibition Day Attendees can visit the exhibition floor on Wednesday, 30 September, without full conference registration.

Why RADECS Matters to JIACO Instruments

RADECS brings together the scientists and engineers who study how radiation affects electronic components and systems, a field where reliable, non-destructive sample preparation is critical. As the technology recognized in the JEDEC JESD22-B120 standard, MIP gives radiation-test teams a way to prepare samples without introducing the damage or artifacts common to acid-based decapsulation.

Meet us at RADECS 2026

Attending RADECS 2026? Visit us at Booth 11 to discuss how Microwave-Induced Plasma technology can support selective decapsulation, controlled material removal, and advanced sample preparation for radiation-related device investigations.

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