- Sep 28 - Oct 2, 2026 | Prague, Czech Republic | Booth 11
Preparing for RADECS 2026
RADiation and its Effects on Components and Systems Conference
JIACO Instruments will be exhibiting at RADECS 2026, the leading European conference on radiation effects in electronics and photonics. You’ll find us at Booth 11 in the Prague Congress Centre throughout the technical sessions and industrial exhibition.
Stop by to see how our Microwave Induced Plasma (MIP) technology supports sample preparation for radiation testing, and to talk through your failure analysis challenges with our team.
Program highlights
Visit Us at Booth 11
Meet the JIACO team at the Prague Congress Centre exhibition floor throughout the conference.
MIP for Radiation-Test Prep
Talk to us about how MIP decapsulation supports sample preparation for radiation effects testing and failure analysis.
See MIP in Action
Ask us about demonstrations and how MIP decapsulation compares to traditional acid-based methods.
Open Exhibition Day
Attendees can visit the exhibition floor on Wednesday, 30 September, without full conference registration.
Why RADECS matters to JIACO Instruments
RADECS brings together the scientists and engineers who study how radiation affects electronic components and systems, a field where reliable, non-destructive sample preparation is critical. As the technology recognized in the JEDEC JESD22-B120 standard, MIP gives radiation-test teams a way to prepare samples without introducing the damage or artifacts common to acid-based decapsulation.
Let's Continue the Conversation
Thank you for visiting JIACO Instruments. Whether we met at a conference, exhibition, workshop or technical presentation, we look forward to continuing the conversation.
Our team supports engineers, researchers and failure analysis specialists with advanced semiconductor sample preparation, controlled material removal and access to critical structures.