Over 50% of medical devices contain electronic components, the working of these components are vital in patient care, diagnosis, and treatment. The integration of semiconductors in medical devices has revolutionized healthcare, leading to more advanced and reliable medical technologies.
The quality and reliability of these semiconductors are of utmost importance, especially when it comes to devices like pacemakers, heartrate monitors, hearing aids, insulin pumps and diagnostic imaging. Without semiconductors, today’s medical breakthroughs would not be possible. And with semiconductors becoming smaller and more complex, more exciting innovation will come.
To ensure that medical devices maintain their reliability and quality, it is essential to analyze the semiconductors used within them. In the paper “CF4-free Microwave Induced Plasma Decapsulation of Automotive Semiconductor Devices”, JIACO Instruments demonstrated that, compared to traditional methods such as acid or CF₄-based plasma decapsulation, their Microwave Induced Plasma (MIP) technology can decapsulate semiconductors without introducing artifacts or causing damage.
Originally validated in high-reliability industries such as automotive electronics, this damage-free approach makes MIP an ideal solution for use in the medical device industry.
Read the full paper here: https://jiaco-instruments.com/istfa-2016/
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